Description:

The Solar Cell I-V Curve Data Acquisition System characterizes the current-voltage (I-V) characteristics of photovoltaic devices with currents up to 20.0 amperes. It calculates the solar cell parameters, generates printable test reports and saves test data in text files. Curves are measured using classic four probes (Kelvin) technique. The system includes electronics, software, rack-mount computer, chuck and cell testing fixture with irradiance monitoring and optional temperature control. It interfaces with the customers’ Solar Simulator or a Solar Simulator can be supplied. System Details Test Fixture The I-V Curve Data Acquisition includes a fixture for holding test devices. This fixture can accommodate cells from small to up to 200 mm x 200 mm. Adjustable cell stops, in the X & Y-axis, are provided to consistently locate the cells for testing. For top cell contacting, two bus bars with multiple spring loaded contacting probes (20 per bus bar) are mounted on a frame. The frame can be manually raised to place the cell on the plate for testing. The cell is held down with vacuum (built-in) during testing. After placing the cell in position, the frame can be manually lowered to make probe contact with the cell. Once in the down position, the frame is held down by clasps to maintain contact with the cell. Optional third bus bar and automatic cell contacting is available upon request. Two back-side voltage contacts are embedded in the platen (galvanically isolated from the platen) and make good electrical contact when the cell is held down by vacuum to the platen. All of the voltage and current probes are gold-plated. Alternative cell contacting mechanisms are available upon request. With the optional Temperature Control, Cell Holding Plate can be either cooled or heated in the temperature range of 5-60 oC using Peltier cells. Temperature of the platen is measured automatically with accuracy of <±0.5 oC and is monitored during cell measurement.

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